The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2019

Filed:

Sep. 28, 2012
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Masako Yamada, Niskayuna, NY (US);

Sandip Maity, Bangalore, IN;

Sameer Dinkar Vartak, Bangalore, IN;

Rajesh Langoju, Bangalore, IN;

Abhijit Patil, Bangalore, IN;

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/45 (2006.01); G01J 3/28 (2006.01); G01N 21/25 (2006.01); G01N 21/55 (2014.01); G01N 21/552 (2014.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01N 21/253 (2013.01); G01N 21/45 (2013.01); G01N 21/55 (2013.01); G01N 21/553 (2013.01); G01N 21/554 (2013.01);
Abstract

A system for detecting an array of samples having detectable samples and at least one reference sample is provided. The system comprises an electromagnetic radiation source, a sensing surface comprising a plurality of sample fields, wherein the plurality of sample fields comprise at least one reference field, a phase difference generator configured to introduce differences in pathlengths of one or more samples in the array of samples, and an imaging spectrometer configured to image one or more samples in the array of samples.


Find Patent Forward Citations

Loading…