The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Dec. 01, 2016
Honeywell International Inc., Morris Plains, NJ (US);
Daniel Endean, Plymouth, MN (US);
Grant Lodden, Minnetrista, MN (US);
John Reinke, Plymouth, MN (US);
Honeywell International Inc., Morris Plains, NJ (US);
Abstract
Systems and methods for noise and drift calibration using dithered calibration, a system comprising a processing unit; and two or more dithered calibrated sensors that provide directional measurements to the processing unit, wherein a dithered calibrated sensor in the dithered calibrated sensors has an input axis that rotates about an axis such that bias error can be removed by the processing unit; wherein the dithered calibrated sensor provides a zero-bias measurement along a first axis and a low-noise measurement along a second axis, the second axis being orthogonal to the first axis; wherein the dithered calibrated sensors are arranged such that the dithered calibrated sensor provide low-noise and zero-bias measurements along the measured axes; and wherein the processing unit executes an algorithm to combine measurements that are along the same axis to produce a measurement for each measured axis that has both low-noise and zero-bias.