The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Oct. 26, 2017
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Assignee:
OMRON Corporation, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G05B 19/05 (2006.01); G05B 19/12 (2006.01); G05B 19/42 (2006.01); B23Q 17/20 (2006.01); G05B 19/401 (2006.01); G05B 19/4097 (2006.01);
U.S. Cl.
CPC ...
G01B 11/026 (2013.01); B23Q 17/20 (2013.01); G05B 19/054 (2013.01); G05B 19/056 (2013.01); G05B 19/12 (2013.01); G05B 19/401 (2013.01); G05B 19/4097 (2013.01); G05B 19/42 (2013.01); G05B 2219/37063 (2013.01); G05B 2219/37117 (2013.01); G05B 2219/49007 (2013.01);
Abstract
A PLC system includes a displacement sensor, drives, and a PLC. The PLC system obtains line measurement data including a plurality of pieces of measurement information or 1D information from the displacement sensor and a plurality of pieces of positional information from the drives that are read in accordance with measurement intervals, generates 2D shape data, and generates 2D shape data as 1D arrangement information for every measurement interval from combination line measurement data combining the 1D information and the positional information.