The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Jan. 11, 2018
Optoelectronics Co., Ltd., Saitama, JP;
Yasutake Kawashima, Saitama, JP;
Ken Fukuba, Saitama, JP;
OPTOELECTRONICS CO., LTD., Saitama, JP;
Abstract
Provided is a dimension measuring apparatus which measures dimensions of a measurement target object without the need of complicated operations by a user. According to dimension measuring apparatus (), laser () radiates laser beams to form at least two feature points on a measurement target object. Decoder () measures a distance from the measurement target object by using reflection light of at least two laser beams reflected on the measurement target object. Imaging sensor (A) captures an image of the measurement target object to which at least the two laser beams are radiated. Dimension measurement section () measures a length of the measurement target object on a line connecting the two feature points on the basis of the distance from the measurement target object, a position of the measurement target object in the image, and positions of the two feature points in the image.