The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Aug. 23, 2016
Applicant:
Datalogic Automation, Inc., Telford, PA (US);
Inventor:
Andrew Hatstat, Lansdale, PA (US);
Assignee:
Datalogic USA, Inc., Eugene, OR (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G01B 11/02 (2006.01); G01C 3/08 (2006.01); G01B 11/24 (2006.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/00 (2013.01); G01B 11/02 (2013.01); G01B 11/24 (2013.01); G01B 11/25 (2013.01); G01C 3/08 (2013.01);
Abstract
First and second reflective portions are angled (e.g., included angle of approximately 178 degrees) with respect to one another to produce a parallax image of a structured light pattern (e.g., linear pattern) projected onto a surface of an object to determine at least one dimension (e.g., range, height, width) associated with the object. The reflections may be detected by a light sensor (e.g., a single linear image sensor) as dual 'differential' parallax images of the structured light pattern, which advantageously inherently causes errors to cancel out.