The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Aug. 01, 2018
Systems and methods for measuring radiated thermal energy during an additive manufacturing operation
Sigma Labs, Inc., Santa Fe, NM (US);
R. Bruce Madigan, Butte, MT (US);
Lars Jacquemetton, Santa Fe, NM (US);
Glenn Wikle, Santa Fe, NM (US);
Mark J. Cola, Santa Fe, NM (US);
Vivek R. Dave, Concord, NH (US);
Darren Beckett, Corrales, NM (US);
Alberto M. Castro, Santa Fe, NM (US);
SIGMA LABS, INC., Santa Fe, NM (US);
Abstract
This disclosure describes various methods and apparatus for characterizing an additive manufacturing process. A method for characterizing the additive manufacturing process can include generating scans of an energy source across a build plane; measuring an amount of energy radiated from the build plane during each of the scans using an optical sensor; determining an area of the build plane traversed during the scans; determining a thermal energy density for the area of the build plane traversed by the scans based upon the amount of energy radiated and the area of the build plane traversed by the scans; mapping the thermal energy density to one or more location of the build plane; determining that the thermal energy density is characterized by a density outside a range of density values; and thereafter, adjusting subsequent scans of the energy source across or proximate the one or more locations of the build plane.