The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Nov. 14, 2014
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Yoshinori Matsui, Hamamatsu, JP;
Kazutaka Suzuki, Hamamatsu, JP;
Haruyoshi Toyoda, Hamamatsu, JP;
Munenori Takumi, Hamamatsu, JP;
Naotoshi Hakamata, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
An eyeblink measurement systemis a measurement apparatus for measuring a subject's eyelid position, and includes a lighting devicethat irradiates light extending across upper to lower eyelids of the subject's eye region E, and an image measurement devicethat has an optical axis Ia on a plane for which a plane including an irradiation optical axis La of the light is rotated by a predetermined angle θ around an axis Aalong the light to be irradiated onto the subject, obtains height information based on the position of an optical image of the light in an image imaged, and measures the eyelid position based on the height information.