The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2019
Filed:
Nov. 19, 2015
Applicants:
Agency for Science, Technology and Research, Singapore, SG;
Kabushiki Kaisha Topcon, Tokyo, JP;
Inventors:
Jun Cheng, Singapore, SG;
Jiang Liu, Singapore, SG;
Wing Kee Damon Wong, Singapore, SG;
Masahiro Akiba, Tokyo, JP;
Assignees:
AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH, Singapore, SG;
KABUSHIKI KAISHA TOPCON, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 3/10 (2006.01); G01B 9/02 (2006.01); A61B 3/00 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); G01B 9/02082 (2013.01); G01B 9/02083 (2013.01); G01B 9/02091 (2013.01); G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 2207/10101 (2013.01);
Abstract
An optical coherence tomography (OCT) image composed of a plurality of A-scans of a structure is analyzed by defining, for each A-scan, a set of neighboring A-scans surrounding the A-slices scan. Following an optional de-noising step, the neighboring A-scans are aligned in the imaging direction, then a matrix X is formed from the aligned A-scans, and matrix completion is performed to obtain a reduced speckle noise image.