The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Jun. 29, 2017
Massachusetts Institute of Technology, Cambridge, MA (US);
John Joseph Leonard, Newton, MA (US);
Sudeep Pillai, Cambridge, MA (US);
Massachusetts Institute of Technology, Cambridge, MA (US);
Abstract
A tunable and iterative stereo mapping technique is provided, capable of identifying disparities at or substantially faster than real-time (e.g., frame-rate of 120 Hz). The method includes identifying a plurality of points in an image, determining disparity values for each of the points in the image and generating a piece-wise planar mesh based on the points and their respective disparity values. A disparity interpolation can be performed on candidate planes using estimated plane parameters for the candidate planes and a disparity image can be generated having a plurality of regions based on the disparity interpolation. Multiple iterations can be performed until the image is reconstructed with an appropriate resolution based on predetermined thresholds. The thresholds can be modified to provide a tunable system by changing the threshold values to either increase a resolution of a final reconstructed image and/or increase a computation speed of the tunable and iterative stereo mapping technique.