The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Jan. 02, 2018
University of Connecticut, Farmington, CT (US);
Guoan Zheng, Vernon, CT (US);
University of Connecticut, Farmington, CT (US);
Abstract
Instruments, assemblies and methods are provided for undertaking imaging techniques (e.g., microscopic imaging techniques). The present disclosure provides improved imaging techniques, equipment and systems. More particularly, the present disclosure provides advantageous microscopy/imaging assemblies with single-frame sample autofocusing using multi-LED illumination. The present disclosure provides for assemblies and methods for single-frame rapid sample autofocusing without a z-scan. Potential applications for the disclosed assemblies/methods include, without limitation, whole slide imaging, optical metrology, wafer inspection, DNA sequencing and other high-throughput imaging applications where the sample may need to be scanned over a large field of view. The assemblies/methods advantageously utilize multiple LEDs for sample illumination. A captured image includes multiple copies of the sample, and one can recover the distance between these copies. The distance is directly related to the defocus distance.