The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Apr. 03, 2017
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Kenji Yoshihira, Princeton Junction, NJ (US);
Zhichun Li, Princeton, NJ (US);
Zhengzhang Chen, Princeton Junction, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Guofei Jiang, Princeton, NJ (US);
LuAn Tang, Pennington, NJ (US);
Assignee:
NEC Corporation, , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 12/24 (2006.01); H04L 12/26 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 41/145 (2013.01); H04L 41/12 (2013.01); H04L 43/045 (2013.01);
Abstract
Methods and systems for reporting anomalous events include building a process graph that models states of process-level events in a network. A topology graph is built that models source and destination relationships between connection events in the network. A set of alerts is clustered based on the process graph and the topology graph. Clustered alerts that exceed a threshold level of trustworthiness are reported.