The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Aug. 27, 2018
Applicant:

Honda Motor Co., Ltd., Minato-ku, Tokyo, JP;

Inventors:

Yuichiro Ikeda, Tochigi-ken, JP;

Kanata Yamashita, Tochigi-ken, JP;

Masaaki Kawamata, Tochigi-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 5/00 (2006.01); H04B 17/15 (2015.01); G07C 5/08 (2006.01); G06T 11/20 (2006.01); H04B 17/29 (2015.01); H04B 17/318 (2015.01); H04B 17/391 (2015.01); H04B 17/23 (2015.01);
U.S. Cl.
CPC ...
H04B 17/15 (2015.01); G06T 11/206 (2013.01); G07C 5/0808 (2013.01); H04B 17/29 (2015.01); H04B 17/318 (2015.01); H04B 17/391 (2015.01); H04B 17/23 (2015.01);
Abstract

An inspection terminal measures a wireless quality of a host machine during inspection of an object to be inspected, and acquires performance measurement data indicative of the wireless quality. An environment measuring device measures a radio wave intensity in the vicinity of the host machine during inspection of the object to be inspected, and acquires environment measurement data indicative of the radio wave intensity. A movable body (vehicle) which is the object to be inspected, or a movable body that transports the object to be inspected, moves together with the inspection terminal and the environment measuring device, through execution points of a plurality of inspection processes performed within an inspection area. A LET server associates the performance measurement data and the environment measurement data with measurement times and/or the inspection processes.


Find Patent Forward Citations

Ikeda, Yuichiro. (2019). Communication state analysis method and communication state analysis system (U.S. Patent No. 10476613). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10476613

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…