The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Dec. 30, 2016
Applicant:

Sunpower Corporation, San Jose, CA (US);

Inventors:

David Aitan Soltz, Mountain View, CA (US);

Yoann Buratti, Santa Clara, CA (US);

Xiuwen Tu, San Jose, CA (US);

Ryan Manuel Lacerda, El Granada, CA (US);

Taiqing Qiu, Los Gatos, CA (US);

Assignee:

SunPower Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02S 50/15 (2014.01); G01N 21/64 (2006.01); H01L 31/18 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
H02S 50/15 (2014.12); G01N 21/6489 (2013.01); G01N 21/9501 (2013.01); H01L 31/18 (2013.01);
Abstract

High throughput systems for photovoltaic UV degradation testing of solar cells, and methods of testing for UV degradation of solar cell during manufacture, are described herein. In an example, a high throughput solar cell testing apparatus includes a plurality of real time ultra-violet (RTUV) testing modules. Each of the RTUV testing modules includes an ultra-violet (UV) light source, an optics assembly for focusing light from the UV light source on a sample area, and a detector for receiving photoluminescence energy from the sample area. The high throughput solar cell testing apparatus also includes an acquisition and control assembly coupled to the plurality of RTUV testing modules.


Find Patent Forward Citations

Loading…