The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Apr. 19, 2017
Applicant:

Sz Dji Technology Co., Ltd., Shenzhen, CN;

Inventors:

Yu Shen, Shenzhen, CN;

Ang Liu, Shenzhen, CN;

Guyue Zhou, Shenzhen, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 19/00 (2011.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06T 2207/10004 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10032 (2013.01); G06T 2207/30181 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30208 (2013.01); G06T 2207/30244 (2013.01);
Abstract

Systems, methods, and devices for calibrating one or more imaging devices are provided. In one aspect, a method comprises: receiving, from each of the one or more imaging devices, a plurality of images of a calibration target comprising a plurality of features and one or more reference markers; determining a spatial relationship between the one or more reference markers in each image of the plurality of images and the one or more reference markers on the calibration target; formulating, based on the spatial relationship, a correspondence between image coordinates of features in each image of the plurality of images and global coordinates for corresponding features on the calibration target; and determining, based on the correspondence, calibration parameters for the one or more imaging devices.


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