The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Sep. 06, 2017
Ngk Insulators, Ltd., Nagoya, JP;
NGK Insulators, Ltd., Nagoya, JP;
Abstract
An inspection method for a surface of a ceramic body capable of determining any crack more reliably than conventionally done is provided. The method includes a step of performing image capturing of an illuminated region of an inspection surface being illuminated with at least one of first and second illumination light from mutually different directions sandwiching an image capturing means, a step of generating a determination image, and a step of performing determination. When a first determination image is generated based on a first image capturing result obtained under illumination at least with the first illumination light, and a second determination image is generated based on a second image capturing result under illumination at least with the second illumination light, those images are generated so that determination of the presence or absence of any crack can be performed based on a difference between formation manners of shadow regions in those images.