The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Jun. 11, 2015
Applicant:

The J. David Gladstone Institutes, San Francisco, CA (US);

Inventors:

Steven M. Finkbeiner, Corte Madera, CA (US);

Dale Michael Ando, San Francisco, CA (US);

Aaron C. Daub, San Francisco, CA (US);

Assignee:

The J. David Gladstone Institutes, San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/34 (2006.01); G06K 9/32 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01); G01N 21/25 (2006.01); G01N 35/00 (2006.01); G06K 9/00 (2006.01); G02B 21/00 (2006.01); G02B 27/32 (2006.01); C12M 1/34 (2006.01);
U.S. Cl.
CPC ...
G06K 9/3216 (2013.01); G01N 21/253 (2013.01); G01N 35/0099 (2013.01); G02B 21/0088 (2013.01); G02B 21/26 (2013.01); G02B 21/365 (2013.01); G02B 27/32 (2013.01); G06K 9/00134 (2013.01); C12M 41/36 (2013.01); G02B 21/34 (2013.01); G06K 2009/3225 (2013.01);
Abstract

The present disclosure provides automated robotic microscopy systems that facilitate high throughput and high content analysis of biological samples, such as living cells and/or tissues. In certain aspects, the systems are configured to reduce user intervention relative to existing technologies, and allow for precise return to and re-imaging of the same field (e.g., the same cell) that has been previously imaged. This capability enables experiments and testing of hypotheses that deal with causality over time with greater precision and throughput than conventional microscopy methods.


Find Patent Forward Citations

Loading…