The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Nov. 08, 2017
Applicant:

Fingerprint Cards Ab, Göteborg, SE;

Inventors:

Frank Riedijk, Delft, NL;

Wouter Brevet, Delft, NL;

Hans Thörnblom, Kungsbacka, SE;

Christer Jansson, Linköping, SE;

Assignee:

Fingerprint Cards AB, Göteborg, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/28 (2006.01); G06K 9/00 (2006.01); G01D 5/24 (2006.01);
U.S. Cl.
CPC ...
G06K 9/001 (2013.01); G01D 5/24 (2013.01); G06K 9/0002 (2013.01);
Abstract

A method of determining a representation of a fingerprint pattern of a finger using a fingerprint sensor comprising a two-dimensional measuring arrangement including a plurality of measuring elements, each comprising a finger electrode spaced apart from the finger by a dielectric structure. For each measurement position, the method comprises the steps of: providing a first measuring element configuration with an elongated first measuring arrangement portion having a first principal direction of extension; and a first peripheral measuring arrangement portion; acquiring a first measurement value for the measurement position; providing a second measuring element configuration having an elongated second measuring arrangement portion having a second principal direction of extension; and a second peripheral measuring arrangement portion; and acquiring a second measurement value for the measurement position. The representation of the fingerprint pattern is determined based on the first measurement value and the second measurement value for each of the measurement positions.


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