Method and system for modeling an electronic device under test (dut) using a kernel method

Abstract

A method provides modeling a DUT and generating a simulated response. The method includes receiving a first portion of a stimulus signal generated by a signal generator, a second portion of the stimulus signal being input to the DUT; receiving a response signal output by the DUT in response to a second portion of the stimulus signal; digitizing the received first portion and the received response signal; correcting the digitized signals; measuring training input series data of the digitized first portion of the stimulus signal and training output series data of the digitized response signal; and utilizing kernel adaptive filtering for extracting a device model from the training input and output series data, and for generating simulated responses of the DUT to subsequent stimulus inputs, respectively. The kernel adaptive filtering may include a kernel least mean squares algorithm, a kernel Affine projection algorithm or a recursive least squares algorithm.