The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Nov. 14, 2017
Vmware, Inc., Palo Alto, CA (US);
Chandrashekhar Jha, Bangalore, IN;
Jobin George, Bangalore, IN;
Prateek Sahu, Bangalore, IN;
Kumar Gaurav, Bangalore, IN;
Jusvinder Singh, Bangalore, IN;
VMware, Inc, Palo Alto, CA (US);
Abstract
Methods and systems are directed to detection and correction of outliers in a dataset stored in a data-storage device. The dataset comprises parameter data that may be stored and organized in the form of a data table with rows and columns of parameter values. Each column of the parameter data is searched for outlier parameter values based on the parameters values in the same column. The parameter data as a whole may be searched for outlier rows of parameter values based on first and second largest variations in the parameter data. Substitute parameter values are determined for the outlier parameter values based on non-outlier parameter values of the parameter data. The substitute parameter values and corresponding outlier parameter values may be displayed in a database management user interface that enables a user to selectively accept or reject each of the substitute parameter values for the corresponding outlier parameter values.