The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Feb. 12, 2018
Applicant:

Microvision, Inc., Redmond, WA (US);

Inventors:

P. Selvan Viswanathan, Bellevue, WA (US);

Jari Honkanen, Monroe, WA (US);

Assignee:

Microvision, Inc., Redmond, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/03 (2006.01); G01S 17/10 (2006.01); G06K 9/00 (2006.01); G06F 3/01 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0325 (2013.01); G01S 17/10 (2013.01); G06K 9/00335 (2013.01); G06K 9/00362 (2013.01); G06F 3/017 (2013.01);
Abstract

A scanned beam 3D sensing system includes smart infrared pulsing to detect objects in a field of view. Infrared laser light pulses are emitted at a first density in a field of view and reflections are detected. Times of flight of the infrared laser light pulses are measured to determine if an object is in the field of view. The density of the infrared pulses may be increased based on various factors. The higher density infrared pulses may be scanned in a region of interest that is a subset of the field of view. Power consumption is reduced by reducing the density of laser pulses when possible.


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