The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
May. 30, 2014
Nikon Corporation, Tokyo, JP;
Yoshitaro Nakano, Tokyo, JP;
Takaaki Okamoto, Tokyo, JP;
NIKON CORPORATION, Tokyo, JP;
Abstract
A microscope device includes an interface detector that detects the position of an interface present in a container containing an observation object and a controller that performs focus maintenance control for maintaining the focal position of an objective lens in a reference position distant from the interface detected by the interface detector in the direction of the optical path of the objective lens by a predetermined distance (an offset value) and, in a time period when an image capture unit is capturing images, changes the focal position from the reference position by moving at least one of the objective lens and observation object in the direction of the optical path with reference to the reference position.