The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Oct. 19, 2018
Carl Zeiss Meditec Ag, Jena, DE;
Artur Hoegele, Oberkochen, DE;
Franz Merz, Aalen, DE;
Christian Beder, Aalen, DE;
Andre Mueller, Koenigsbronn-Zang, DE;
Daniel Kolster, Oberkochen, DE;
Peter Reimer, Ellwangen, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A microscope having an observation beam path including a main objective, an OCT device including a first detection beam path, a wavefront measuring device including a second detection beam path, a first, a second and a third optics group is provided, wherein the first detection beam path contains the main objective and the first to third optics group, and the first to third optics group forms an afocal imaging optical unit of the first detection beam path and the second detection beam path contains the main objective, the first optics group and the second optics group, and the main objective and the first and second optics group form an afocal imaging optical unit of the second detection beam path.