The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

May. 03, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Jun Kawanabe, Kawasaki, JP;

Minoru Watanabe, Yokohama, JP;

Keigo Yokoyama, Kawasaki, JP;

Sho Sato, Tokyo, JP;

Kentaro Fujiyoshi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G01T 1/02 (2006.01); A61B 6/00 (2006.01); H04N 5/32 (2006.01); H04N 5/369 (2011.01); H04N 5/378 (2011.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); A61B 6/42 (2013.01); A61B 6/54 (2013.01); G01T 1/023 (2013.01); G01T 1/026 (2013.01); H04N 5/32 (2013.01); H04N 5/3696 (2013.01); H04N 5/378 (2013.01); A61B 6/4233 (2013.01); A61B 6/542 (2013.01);
Abstract

A radiation imaging apparatus including conversion elements acquiring a radiation image and detectors, a readout unit and a controller is provided. In a first operation, the controller causes the readout unit to output a composition signal obtained by composing signals from the detectors, detects irradiation with radiation based on the composition signal, and shifts to a second operation. In the second operation, the controller acquires first signals individually read out from the detectors, decides a signal component, of the composition signal, which is output from a selected detector of the detectors in accordance with a ratio of the first signal from the selected detector to a sum of the first signals, and acquires an integrated dose of radiation incident on the selected detector based on the signal component and the first signal of the selected detector.


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