The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Mar. 18, 2019
Fanuc Corporation, Yamanashi, JP;
Yoshinori Murakami, Yamanashi, JP;
FANUC CORPORATION, Yamanshi, JP;
Abstract
An object is to provide a laser processing device and a laser processing system capable of measuring a distance between a work and a processing head accurately and simply and capable of checking the quality of processing in real time during the processing. Provided are: a photodetector that detects the intensity of a processing laser beam split by optical path splitting means, and outputs a detection signal having a signal intensity responsive to the detected intensity together with a time of detection of the intensity; a signal intensity comparing unit that compares the signal intensities of multiple detection signals received from the photodetector; and a detection time comparing unit that compares times of detection of multiple intensities. The signal intensity comparing unit measures a processing quality by comparing the signal intensity of a detection signal received from the photodetector responsive to an incident beam on a work and the signal intensity of a detection signal received from the photodetector responsive to a reflected beam from the work. The detection time comparing unit measures a distance between a laser processing device and the work by comparing times of detection of the intensities.