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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10473769 B1

PDFFull Text
Date of Patent:
Nov. 12, 2019

Filed:

Aug. 30, 2017

Distance measuring apparatus and distance image photographing apparatus

Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Yasuhiro Shinozuka, Fuchu, JP;

Akihide Sai, Yokohama, JP;

Assignee:

KABUSHIKI KAISHA TOSHIBA, Minato-ku, JP;

Attorney:

Oblon, McClelland, Maier & Neustadt, L.L.P.

Primary Examiner:

Mark Hellner

Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/486 (2006.01); G01S 17/10 (2006.01); G01S 7/497 (2006.01); G01S 17/89 (2006.01); G01S 17/42 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4865 (2013.01); G01S 7/4861 (2013.01); G01S 7/497 (2013.01); G01S 17/10 (2013.01); G01S 17/89 (2013.01); G01S 17/42 (2013.01);
Abstract

According to an embodiment, a distance measuring apparatus includes an irradiator that emits an irradiation wave to a measuring target, a first detector that directly detects the irradiation wave, a second detector that detects a reflection wave, a simulation signal generator that generates a simulation signal, a first meter that measures a first time and an emission time of the irradiation wave, a second meter that measures a second time and an incidence time of the reflection wave, a first subtractor that subtracts the emission time from the incidence time to obtain a measurement time period, and that subtracts the first time from the second time to obtain an error time period and a second subtractor that subtracts the error time period from the measurement time period to obtain an offset measurement time period.

Find Patent Forward Citations

Shinozuka, Yasuhiro. (2019). Distance measuring apparatus and distance image photographing apparatus (U.S. Patent No. 10473769). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10473769

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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