The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Feb. 28, 2017
Applicant:

Inspirain Technologies Pte Ltd., Singapore, SG;

Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 27/06 (2006.01); G01R 27/32 (2006.01);
U.S. Cl.
CPC ...
G01R 27/28 (2013.01); G01R 27/06 (2013.01); G01R 27/32 (2013.01);
Abstract

A mixed mode vector network analyzer (VNA) system to measure S-parameters and DC parameters of a differential device under test (DUT) is provided. The mixed mode VNA system measures mixed mode S-parameter measurements (i.e., AC measurements) using an independent resistive reflectometer bridge connected to each of the two ports of the differential DUT. The mixed mode VNA system further measures DC parameters of the differential DUT without impacting the measurement of S-parameters. In one embodiment, the mixed mode VNA system is used to measure multi-port differential DUT. Coupling capacitors provide low enough impedance to even the smallest RF frequency of AC measurement (i.e., measurement of S-parameters).


Find Patent Forward Citations

Pandya, Harshang. (2019). Mixed mode vector network analyser (U.S. Patent No. 10473704). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10473704

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…