The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Aug. 02, 2017
Sartorius Stedim Biotech Gmbh, Goettingen, DE;
Magnus Stering, Le mesnil le roi, FR;
Abstract
A method for improving reliability of an integrity or leak test includes determining at least one first parameter indicative of: a first volume of a sample, a first temperature of the sample, a first pressure of the sample and/or a first assessment of integrity of the sample. The method further determines at least one second parameter indicative of a deviation from the first parameter and at least one third parameter indicative of a second assessment of the integrity of the sample. The second assessment provides an indication of a passed or failed test. The method further determines whether the deviation has an impact on the indication of the second assessment. When the deviation is determined to have an impact on the indication of the second assessment, the method comprises identifying a possibility that the indication of the second assessment is incorrect.