The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Dec. 17, 2015
Applicant:
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Inventor:
Andy Chan, Franklin, MA (US);
Assignee:
Siemens Healthcare Diagnostics Inc., Tarrytown, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); G01N 33/543 (2006.01); G01N 33/66 (2006.01); G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 33/487 (2013.01); G01N 27/327 (2013.01); G01N 33/5438 (2013.01); G01N 33/54393 (2013.01); G01N 33/66 (2013.01);
Abstract
There is described a process for improving precision in an analytical test for a target analyte in a sample. The process includes prior to analyzing the sample for a target analyte via a biosensor, introducing to an analytical zone defined by the biosensor a fluid comprising an effective amount of the target analyte.
Chan, Andy. (2019). Methods and systems for improving precision of measurements for reduced sample volumes (U.S. Patent No. 10473638). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10473638
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile