The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Jun. 12, 2014
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Yoshiki Tainaka, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); H01J 49/26 (2006.01); G01N 30/86 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8658 (2013.01); G01N 30/7233 (2013.01); H01J 49/0036 (2013.01);
Abstract

A check condition setting screen, for confirming, whether a target ion originates from a target compound, is provided with qualifier ion mode choices: 'ABSOLUTE TOLERATION,' 'RELATIVE TOLERATION', and “ABSOLUTE TOLERATION OR RELATIVE TOLERATION”. When the “ABSOLUTE TOLERATION OR RELATIVE TOLERATION” mode is set, an identification range Pa is calculated from a qualifier ion ratio reference value and an absolute tolerance, and an identification range Pr is calculated from the qualifier ion ratio reference value and a relative tolerance, for each qualifier ion for one target ion, and whichever of the two identification ranges is the greater is selected. In addition, when a setting to limit the upper limit value of an identification range to 100% is enabled, the upper limit value of the identification range is limited to 100%, and when the lower limit value of the identification range exceeds 100%, a warning display indicating above upper limit is performed.


Find Patent Forward Citations

Tainaka, Yoshiki. (2019). Data processing device for mass spectrometry and program for said device (U.S. Patent No. 10473634). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10473634

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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