The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Feb. 20, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Goro Kambe, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/043 (2013.01); G01N 23/083 (2013.01); G01N 2223/3307 (2013.01); G01N 2223/6113 (2013.01); G01N 2223/6116 (2013.01);
Abstract

An X-ray inspection apparatus includes an X-ray source, an X-ray detector, and a stage. A dose rate calculation unit of a control section calculates a dose rate at any position in an inspection space, a stage face information storage unitstores stage face information, an irradiation history monitoring unit monitors a movement locus, a stage face cumulative irradiation dose calculation unit calculates cumulative irradiation dose distribution data, a stage face imaging range calculation unit calculates a stage face imaging range of the X-ray detector, and a dose distribution image display control unit extracts the cumulative irradiation dose distribution data in an imaging range and displays an image thereof.


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