The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Sep. 11, 2017
Applicant:

Magellan Diagnostics, Inc., North Billerica, MA (US);

Inventors:

Norman F. Sheppard, Jr., New Ipswich, NH (US);

Gary Conrad Jensen, Cambridge, MA (US);

Assignee:

Magellan Diagnostics, Inc., North Billerica, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 33/49 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 21/474 (2013.01); G01N 33/49 (2013.01); G01N 2201/062 (2013.01); G01N 2201/0625 (2013.01); G01N 2201/0696 (2013.01);
Abstract

A sensor and analyzer for measuring an analyte in a liquid sample are disclosed. The sensor includes a substrate with a reservoir disposed therein. The reservoir may include a top surface and a bottom surface, at least one transparent portion forming at least a part of the bottom surface of the reservoir, and a reflector disposed on the upper surface of the reservoir at a location opposite the at least one transparent portion. The analyzer may include a support surface, an aperture extending through the support surface, a light source disposed below the support surface and oriented so that at least a portion of the light emitted from the light source passes through the aperture, and a detector configured to measure an intensity of light received at the detector.


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