The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
May. 18, 2018
Raytheon Company, Waltham, MA (US);
James R. Chow, San Gabriel, CA (US);
Kalin Spariosu, Thousand Oak, CA (US);
Stephanie Lin, Redondo Beach, CA (US);
Kurt S. Ketola, El Segundo, CA (US);
Tom Huang, Torrance, CA (US);
Edward Ward, Jr., Redondo Beach, CA (US);
RAYTHEON COMPANY, Waltham, MA (US);
Abstract
A light source, calibration device and method of calibrating an imaging device is disclose. The calibration device includes the light source which includes an ultraviolet light layer that, in operation, generates ultraviolet light, and a quantum dot layer that absorbs the ultraviolet light and, in response, generates radiation within the near infrared region at a selected intensity. The near infrared light is received at the selected intensity at the imaging device and a sensitivity of the imaging device is altered to detect the near infrared light at the selected intensity provided by the light source.