The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Apr. 11, 2018
Applicant:

National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);

Inventors:

Nicholas Leathe, Albuquerque, NM (US);

Nicolas Argibay, Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 7/00 (2006.01); B29C 64/386 (2017.01); G01N 27/20 (2006.01); B33Y 40/00 (2015.01); B33Y 70/00 (2015.01); B29C 64/153 (2017.01); B22F 3/105 (2006.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
G01M 7/00 (2013.01); B29C 64/386 (2017.08); G01N 27/20 (2013.01); B22F 2003/1057 (2013.01); B29C 64/153 (2017.08); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12); B33Y 70/00 (2014.12);
Abstract

The present invention relates to an additively manufactured (AM), monolithic, multi-axis linear flexural cantilever test artifact. The artifact is monolithic in that is it one continuous part with no assembly. The artifact can be non-destructively evaluated and includes a support frame, cantilevers, and a mount.


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