The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Jan. 28, 2019
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventor:

Tsugio Gomi, Fujimi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/46 (2006.01); B41F 33/00 (2006.01); G01J 3/26 (2006.01); G01J 3/50 (2006.01); G01J 3/52 (2006.01);
U.S. Cl.
CPC ...
G01J 3/46 (2013.01); B41F 33/0036 (2013.01); G01J 3/26 (2013.01); G01J 3/50 (2013.01); G01J 3/524 (2013.01);
Abstract

A measuring device is a measuring device that performs colorimetry of an evaluation patch formed on a medium and a paper white patch that is a portion exposed by the medium. The measuring device has a light source portion that irradiates the medium with an illumination light, a measurement portion that acquires an amount of light from the medium as a measurement value, a memory that holds a paper white standard value that is a reference measurement value of the paper white patch, and a colorimetry unit that corrects a measurement value of the evaluation patch based on the measurement value of the paper white patch and the paper white standard value. Even in a case where a measurement position is changed, a reflectance of the evaluation patch is accurately calculated and a chromaticity of the evaluation patch can be accurately acquired.


Find Patent Forward Citations

Loading…