The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Jun. 23, 2015
Applicant:

Gwangju Institute of Science and Technology, Gwangju, KR;

Inventors:

Bok Hyeon Kim, Gwangju, KR;

Kyoung Won Kim, Gwangju, KR;

Hoon soo Kang, Gwangju, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01J 9/00 (2006.01); G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35374 (2013.01); G01D 5/35303 (2013.01); G01J 1/04 (2013.01); G01J 9/00 (2013.01);
Abstract

The disclosure relates to an optical characteristic measurement system including at least: a light source unit which outputs an input beam of a specific wavelength; a sensing unit which generates a signal beam by using a sensor whose optical characteristic is affected by an external environment condition; and a measuring unit which derives varied physical amount by using the signal beam delivered from the sensing unit, wherein the measuring unit includes: an optical coupler which distributes the signal beam into the two optical paths; and an interrogation optical fiber which is arranged on one of the paths on which the signal beam travels. The interrogation optical fiber has a linear light absorption characteristic in the specific wavelength range, and the light intensity of the signal beam is measured to detect a wavelength of the signal beam delivered from the sensing unit, and finally derive the physical amount applied from outside.


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