The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Dec. 09, 2016
Applicant:

Honeywell International Inc., Morris Plains, NJ (US);

Inventors:

Jindrich Dunik, Plzen, CZ;

Milos Sotak, Slavkov u Brna, CZ;

Milos Vesely, Nemcice, CZ;

Wesley J. Hawkinson, Chanhassen, MN (US);

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/16 (2006.01); G01C 21/30 (2006.01);
U.S. Cl.
CPC ...
G01C 21/165 (2013.01); G01C 21/30 (2013.01);
Abstract

A method is provided. The method comprises: initializing a point mass filter; initializing the one or more Bayesian filters; obtaining measurement data associated with a horizontal position on a surface; obtaining measurement data of a horizontal position and a velocity; obtaining geo-mapping data; estimating, with the point mass filter, the horizontal position on the surface based upon the geo-mapping data and the measurement data; estimating, with the one or more Bayesian filters, remaining state parameters based upon an output of the point mass filter and the measurement data; predicting, with the point mass filter, an a priori horizontal position, on a surface for a future time when the next measurement data will be obtained; and predicting, with the one or more Bayesian filters, an a priori remaining state parameters for a future time when the next measurement data will be obtained.


Find Patent Forward Citations

Loading…