The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Jan. 17, 2019
Cubic Corporation, San Diego, CA (US);
Cubic Corporation, San Diego, CA (US);
Abstract
An inertial measurement unit includes a substrate having MEMS gyroscopes arranged on the substrate as opposing pairs. The gyroscopes of each opposing pair are arranged on opposite sides of an axis of rotation of the substrate and each opposing pair has a central axis that intersects an axis of rotation of the substrate. A processor receives a rotational measurement from each gyroscope, compares the measurements from gyroscopes of each opposing pair, determines a mean or median rotation value for each opposing pair, and compares the mean or median rotation value with a threshold value. The processor assigns a weight to the mean or median value for each opposing pair and determines a rotation of the cuboid inertial measurement unit based on the mean or median value for each opposing pair and the respective weight for the mean or median value for each opposing pair.