The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2019

Filed:

Sep. 21, 2015
Applicant:

Kabushiki Kaisha Topcon, Itabashi-ku, JP;

Inventors:

Kaoru Kumagai, Itabashi-ku, JP;

Kunihiro Hayashi, Itabachi-ku, JP;

Naoto Kasori, Itabachi-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 11/00 (2006.01); G01C 11/02 (2006.01);
U.S. Cl.
CPC ...
G01B 11/00 (2013.01); G01C 11/02 (2013.01);
Abstract

A position at which evaluation of a defect was performed is easily identified. Relative positional relationships between three-dimensional coordinates of feature points of a photographed object and positions of a panoramic cameraare calculated based on a moving image, which is photographed by the panoramic camerawhile a vehicletravels. The position of the object photographed by a hyperspectral camerais calculated based on the relative positional relationships and exterior orientation parameters of the hyperspectral camerawith respect to the panoramic camera


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