The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Aug. 07, 2015
Essilor International (Compagnie Generale D'optique), Charenton-le-Pont, FR;
Xavier Bultez, Charenton-le-Pont, FR;
Jerome Moine, Charenton-le-Pont, FR;
Guillaume Bolteau, Charenton-le-Pont, FR;
Jean-Pierre Chauveau, Charenton-le-Pont, FR;
ESSILOR INTERNATIONAL, Charenton-le-Pont, FR;
Abstract
Disclosed is a method for determining location of a lens machining tool () having an offset location according to a first direction (Y) smaller than a first predetermined threshold, including the steps of manufacturing a calibration piece () according to a predetermined theoretical geometry by using the lens machining tool for providing a at least partially annular groove in a main surface of the calibration piece, the at least partially annular groove being configured to form at least one sharp edge defining a slope discontinuity on the main surface; measuring a distance between the at least one sharp edge and a turning center of the calibration piece for providing data of geometrical characteristics of the calibration piece; and deducing from the measured data a location of the lens machining tool according to a second direction (X) distinct from the first direction.