The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Apr. 25, 2017
Siemens Healthcare Gmbh, Erlangen, DE;
Ute Feuerlein, Erlangen, DE;
Stefan Grosskopf, Nuremberg, DE;
Grzegorz Soza, Heroldsberg, DE;
Michael Suehling, Erlangen, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
A method for defining scanning parameters of a CT scan of a region of interest of an examination object (O) using a CT system is described. In an embodiment of the method, external image capture of external features of the examination object is carried out using an additional image capture unit. In addition, at least one scanning parameter in the axial direction of the CT system is determined on the basis of the external image capture. Finally, a CT scan is performed using the at least one scanning parameter determined. A CT scan range defining device is additionally described. A computed tomography system is also described.