The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Sep. 20, 2017
Nidek Co., Ltd., Gamagori, Aichi, JP;
Michihiro Takii, Aichi, JP;
Noriji Kawai, Aichi, JP;
Taeko Horino, Aichi, JP;
Hisashi Ochi, Aichi, JP;
Kazunori Shibata, Aichi, JP;
NIDEK CO., LTD., Gamagori, Aichi, JP;
Abstract
An optometry apparatus includes: an optical characteristic measurement device configured to measure an optical characteristic of right and left subject eyes in a both-eye opened state by projecting a visual target onto the subject eyes; an anterior ocular segment acquisition device configured to acquire anterior ocular segment images of the right and left subject eyes by the optical characteristic measurement device during the measurement of the optical characteristic of the subject eye in the both-eye opened state; and a controller configured to execute: an analysis instruction for performing analysis processing on the anterior ocular segment images acquired by the anterior ocular segment acquisition device to acquire both-eye opened state information; a determination instruction for determining whether the both-eye opened state information acquired by the analysis instruction is favorable or not, to acquire determination information; and an output instruction for outputting the determination information acquired by the determination instruction.