The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Oct. 31, 2014
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Masaharu Nagata, Tokyo, JP;

Yasuhiro Matsui, Kanagawa, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/204 (2018.01); H04N 13/254 (2018.01); H04N 13/271 (2018.01); H04N 13/239 (2018.01); G01B 11/25 (2006.01); G06T 5/50 (2006.01); H04N 5/33 (2006.01); H04N 13/257 (2018.01); H04N 13/00 (2018.01);
U.S. Cl.
CPC ...
H04N 13/204 (2018.05); G01B 11/2513 (2013.01); G01B 11/2545 (2013.01); G06T 5/50 (2013.01); H04N 5/33 (2013.01); H04N 13/239 (2018.05); H04N 13/254 (2018.05); H04N 13/257 (2018.05); H04N 13/271 (2018.05); G06T 2207/10012 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20221 (2013.01); H04N 2013/0081 (2013.01); H04N 2013/0092 (2013.01);
Abstract

There is an image processing device to obtain more accurate depth information, based on a pattern-irradiated infrared image and a pattern-irradiation-free infrared image. The image processing device includes a pattern irradiation unit that irradiates an infrared pattern onto a surface of a target object; and an infrared image capturing unit that captures an infrared image. The pattern irradiation unit performs irradiation at a predetermined timing corresponding to an infrared image capturing unit's image capturing timing. The infrared image capturing unit obtains a pattern-projected infrared image in which the pattern irradiated by the pattern irradiation unit is projected on the target object, and a pattern-free infrared image in which the pattern is not projected on the target object.


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