The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Jun. 22, 2016
Applicant:

Nidec Copal Corporation, Tokyo, JP;

Inventors:

Haruhiko Mandai, Tokyo, JP;

Yuta Nakamura, Tokyo, JP;

Masaki Nakashima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/00 (2011.01); B60R 11/04 (2006.01); H04N 5/225 (2006.01); B60R 11/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2254 (2013.01); B60R 11/04 (2013.01); H04N 5/2252 (2013.01); H04N 5/2253 (2013.01); B60R 2011/0026 (2013.01);
Abstract

An imaging unit has an imaging device that has an imaging lens; a case that encloses an imaging device and that has an imaging portion for passing light that is to be incident into an imaging lens; and an extending portion that extends from the opening portion in the imaging direction of the imaging device. The extending portion has an extending surface that is provided with a scattering portion for scattering light through structural units. Each structural unit has a surface structure for reflecting, in at least two mutually differing directions that are inclined in relation to a first vertical plane, light that is inclined in the imaging direction relative to an axis that is perpendicular to the extending surface, and that is parallel to a first vertical plane that is perpendicular to the extending surface and that includes the optical axis of the imaging lens.


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