The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Jan. 12, 2017
Sandisk Technologies Llc, Plano, TX (US);
Xiaoheng Chen, Milpitas, CA (US);
Wei Wang, Milpitas, CA (US);
Jingfeng Yuan, Milpitas, CA (US);
Jeffrey L. Whaley, Milpitas, CA (US);
SanDisk Technologies LLC, Plano, TX (US);
Abstract
A storage device with a memory may optimize the setting of a read threshold or read level. A feedback mechanism may be used responsive to there being a read retry error for providing the read threshold from the read retry. Specifically, recovery from a read failure can provide feedback information for dynamically optimizing read threshold values. Read threshold adjustments may occur each time there is a successful error recovery. The read threshold adjustment scheme may select one logical page or multiple logical pages from a recovered region. If a read threshold is found to be working, this threshold may be part of a feedback message to make an informed adjustment that optimizes the read threshold of other pages.