The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Mar. 20, 2017
Applicant:

Wipro Limited, Bangalore, IN;

Inventors:

Girish Raghavan, Chennai, IN;

Venkatesan Marimuthu, Chennai, IN;

Saravanan Kalimuthu, Chennai, IN;

Prashanth A Davey, Chennai, IN;

Thamilchelvi Peterbarnabas, Chennai, IN;

Selvan Nagaraja, Bangalore, IN;

Assignee:

Wipro Limited, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 16/21 (2019.01); G06F 16/903 (2019.01); G06F 16/2452 (2019.01); G06F 16/9032 (2019.01); G06F 16/25 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3684 (2013.01); G06F 11/3668 (2013.01); G06F 16/21 (2019.01); G06F 16/24522 (2019.01); G06F 16/25 (2019.01); G06F 16/90332 (2019.01); G06F 16/90335 (2019.01);
Abstract

The present disclosure relates to a method and system for generating and transforming test data. The one embodiment, a user query is received in natural language and parsed to generate keywords using lemmatization. Based on the generated keywords and filter conditions in the user query, a data source specific executable query suitable for data sources is generated and executed against each data source to generate test data. The method determines if there are any missing test data in the generated test data and creates missing test data based on the data type, number of records required. The method also automatically transforms the generated test data into corresponding test data suitable to the requirements of a target system. Thus, the system generates test data specific to different data sources based on query provided in natural language and transforms the generated test data to comply with the requirements of the target system.


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Raghavan, Girish. (2019). Method of generating and transforming test data and a system therefor (U.S. Patent No. 10467130). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10467130

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