The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Jul. 14, 2016
International Business Machines Corporation, Armonk, NY (US);
Neil S. Bhargava, Austin, TX (US);
Freddys M. Espinoza, Austin, TX (US);
Stefan A. Gert Van Der Stockt, Gauteng, ZA;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A hierarchical data processor test system (and method) is usable to configure a hierarchical plurality of similarity operators and process predetermined input test data through a data processor under test (DPUT) to produce corresponding DPUT output data. The test system is further usable to process the DPUT output data and the predetermined output test data through at least some of the plurality of similarity operators in hierarchical order, determine a highest order similarity operator that indicates a match between the DPUT output data and the predetermined output test data, and compute a confidence score based on the highest order similarity operator that indicated the match. Based on the confidence score exceeding a threshold, the test system also may include activating the DPUT for use by non-test data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile