The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Dec. 15, 2016
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Leehod Baruch, Rishon Leziyon, IL;

Assaf Natanzon, Tel Aviv, IL;

Philip Shilane, Newtown, PA (US);

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 11/14 (2006.01); H04L 29/08 (2006.01); G06F 16/11 (2019.01); G06F 16/22 (2019.01);
U.S. Cl.
CPC ...
G06F 11/1446 (2013.01); G06F 16/128 (2019.01); G06F 16/2255 (2019.01); H04L 67/1097 (2013.01); G06F 11/1464 (2013.01); G06F 2201/84 (2013.01);
Abstract

Described embodiments provide systems and methods for operating a storage system that may determine one or more properties for each of a plurality of input/output (I/O) to a production volume of a storage system and monitor one or more operating conditions of the storage system. Embodiments may further include determining a score for each I/O based upon one or more of: the one or more properties of the I/O and the one or more operating conditions; adapting a replication threshold based upon the one or more operating conditions; comparing the determined score for each I/O to the adapted replication threshold; and based upon the comparison, performing continuous replication or snapshot replication for each I/O.


Find Patent Forward Citations

Loading…