The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Aug. 29, 2017
Applicant:

SK Hynix Inc., Gyeonggi-do, KR;

Inventors:

Jong-Hyun Park, Gyeonggi-do, KR;

Sung-Eun Lee, Gyeonggi-do, KR;

Ja-Hyun Koo, Gyeonggi-do, KR;

Seung-Gyu Jeong, Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/10 (2006.01); H03M 13/15 (2006.01); G11C 7/10 (2006.01); G11B 20/18 (2006.01); G11C 11/4078 (2006.01); G11C 11/56 (2006.01); G11C 29/52 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 5/04 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1056 (2013.01); G06F 11/1048 (2013.01); G11B 20/1833 (2013.01); G11C 7/1006 (2013.01); G11C 11/4078 (2013.01); G11C 11/5628 (2013.01); G11C 29/42 (2013.01); G11C 29/4401 (2013.01); G11C 29/52 (2013.01); H03M 13/1515 (2013.01); G11C 5/04 (2013.01); G11C 2029/0411 (2013.01);
Abstract

An error correcting method of a memory system includes: reading read data and an error correction code from a plurality of memory chips; correcting an error of the read data using the error correction code; temporarily storing the read data and the error correction code in a buffer when the correcting of the error fails; writing a certain input test pattern in the plurality of memory chips, reading an output test pattern written in the plurality of memory chips, and detecting a fail chip in which a chipkill occurs; recorrecting, based on a location of the detected fail chip, the error of the read data stored in the buffer using the error correction code stored in the buffer; and rewriting error-corrected read data and the error correction code in the plurality of memory chips.


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