The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2019
Filed:
Oct. 29, 2015
International Business Machines Corporation, Armonk, NY (US);
Ali Anwar, Blacksburg, VA (US);
Andrzej Kochut, Mount Kisco, NY (US);
Anca Sailer, Scarsdale, NY (US);
Charles O. Schulz, Ridgefield, CT (US);
Alla Segal, Mount Kisco, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Systems and methods are provided for dynamic metering adjustment for service management of a computing platform. For example, a plurality of virtual machines are provisioned across a plurality of computing nodes of a computing platform. Data samples are collected for a metric that is monitored with regard to resource utilization in the computing platform by the virtual machines. The data samples are initially collected at a predefined sampling frequency. The data samples collected over time for the metric are analyzed to determine an amount of deviation in values of the collected data samples. A new sampling frequency is determined for collecting data samples for the metric based on the determined amount of deviation. The new sampling frequency is applied to collect data samples for the metric, wherein the new sampling frequency is less than the predefined sampling frequency.