The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2019

Filed:

Oct. 27, 2017
Applicant:

Integrity Applications Incorporated, Carlsbad, CA (US);

Inventor:

James A. Georges, III, Brighton, MI (US);

Assignee:

Centauri, LLC, Chantilly, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03H 1/04 (2006.01); G03H 1/16 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0443 (2013.01); G03H 1/0465 (2013.01); G03H 1/16 (2013.01); G03H 2001/045 (2013.01); G03H 2001/0445 (2013.01); G03H 2001/0452 (2013.01); G03H 2001/0469 (2013.01); G03H 2210/30 (2013.01);
Abstract

Systems and methods for simultaneous multi-channel off-axis holography are described. Multi-channel imaging systems can include a light system including a plurality of light sources configured to generate illumination and reference beams at a plurality of wavelengths, an illumination system configured to illuminate a target object with the illumination beams, an optical assembly configured to receive a reflected target beam and condition the target beam for recording at an optical imaging system, and a reference system configured to propagate the reference beams to the optical imaging system. The reference beams are interfered with the target beam at the optical imaging system to create interference patterns, which can be recorded in a collective image having a plurality of side lobes. Holographic information in the side lobes can be combined to generate 3D images having a substantially reduced signal to noise ratio.


Find Patent Forward Citations

Loading…